SBIR-STTR Award

Planar, Low Switching Loss, Gallium Nitride Devices for Power Conversion Applications
Award last edited on: 11/8/2018

Sponsored Program
SBIR
Awarding Agency
DOD : Navy
Total Award Amount
$796,793
Award Phase
2
Solicitation Topic Code
N121-090
Principal Investigator
Natalia Palacios

Company Information

Cambridge Electronics Inc (AKA: Tomas Palacios)

501 Massachusetts Avenue
Cambridge, MA 02139
   (617) 710-7013
   tpalacios@gmail.com
   www.gantechnology.com
Location: Single
Congr. District: 07
County: Middlesex

Phase I

Contract Number: N00014-12-M-0293
Start Date: 5/7/2012    Completed: 3/8/2013
Phase I year
2012
Phase I Amount
$150,000
Cambridge Electronics will develop a new generation of power electronic switches based on gallium nitride (GaN) semiconductors. These switches will be optimized for 1000-V operation and switching frequencies in excess of 1 MHz. To maximize the device performance, this project will demonstrate a new fabrication technology that significantly increases the breakdown voltage of GaN transistors and reduces their leakage current and on resistance. The threshold voltage of these devices will be in excess of 1 V.

Keywords:
Transistors, Transistors, Power Electronics, Gallium Nitride

Phase II

Contract Number: N00014-13-C-0230
Start Date: 6/21/2013    Completed: 6/30/2014
Phase II year
2013
(last award dollars: 2017)
Phase II Amount
$646,793

This program aims to develop the technology for a new generation of normally-off GaN power transistors with breakdown voltages of 1000 V and linear current of 50 A. These devices will be fabricated through a combination of novel epitaxial structures and advanced fabrication technologies. Thanks to the very high critical electric field of GaN, in addition to the excellent transport properties of high electron mobility transistors, these devices will show much lower input and output capacitance than the state-of-the-art devices commercially available today, which will allow much higher switching frequencies and lower losses. The device performance will be tested through the fabrication of a power conversion circuit with efficiencies exceeding 90 %.

Keywords:
Gan, Gan, Power Electronics, Normally-Off Transistors, High Electron Mobility Transistor, Dc-Dc Power Circuit