Diamond films on devices are an excellent candidate for dissipation of self-generated thermal loads in integrated circuits and multichip modules. In fact, due to the potential advantages of incorporating diamond film deposition as another step in semiconductor manufacturing, a low temperature deposition process on completed devices is extremely desirable. However, development of such a process using chemical vapor deposition (CVD) of diamond at practical rates (near 1 micron/hour) and at low temperatures (in the 400 to 500 degrees range) has so far eluded researchers. Microwave plasma enhanced CVD of diamond using halogen-based chemistries has been used successfully during Phase I to achieve deposition at temperatures as low as 200 degrees C. For Phase II, we propose a halogen-based chemistry, high power density microwave discharge as a sound approach to achieving CVD diamond deposition at the practical rates previously mentioned. The proposed technique is based on the already demonstrated success of the high power density process in increasing the diamond deposition rates by a factor of 20 in C/H/O systems. Higher circuit integration and faster clock speeds will require diamond for thermal management. A low temperature deposition process will also allow deposition on glass, fiber optics, and other optical elements. Wear- and corrosion-resistant diamond coatings on non-refractory materials such as steels will be possible.