
Atomic Force Microscope Probes with Integrated Resonant Strain GaugesAward last edited on: 11/20/2017
Sponsored Program
SBIRAwarding Agency
DOETotal Award Amount
$150,000Award Phase
1Solicitation Topic Code
07bPrincipal Investigator
Allistair MosesCompany Information
FemtoScale Inc (AKA: Femto Scale Inc)
3888 E Mexico Avenue Suite 254
Denver, CO 80210
Denver, CO 80210
(303) 881-7359 |
info@femtoscale.com |
www.femtoscale.com |
Location: Single
Congr. District: 01
County: Denver
Congr. District: 01
County: Denver
Phase I
Contract Number: DE-SC0013154Start Date: 2/17/2015 Completed: 11/16/2015
Phase I year
2015Phase I Amount
$150,000Benefits:
Upon successful development the proposed probes can be used along with the existing AFM systems in frequency modulated mode offering unprecedented simplicity and flexibility. Furthermore, the probes with integrated MEMS sensors, along with the computer interfaced fully electronic readout modules that will be developed under this project can constitute a simple ultra-low cost and easy to use AFM that could be an add-on to any probe station or microscope. The proposed technology could therefore revolutionize the AFM industry by enabling highly affordable and easy to use AFM systems applicable in a variety of new areas. The low price, potentially starting below $5k could encourage addition of AFM capabilities in a large number of research and educational labs as well as manufacturing environments nationwide.
Keywords:
Atomic Force Microscopy, AFM, MEMS, Nanomechanics, Electromechanical Resonator, Resonant Strain Gauge, AFM Cantilever, MEMS Cantilever Summary for Members of Congress: The Atomic Force Microscope (AFM) has been credited for opening the world to nanotechnology. This project aims at development of a new class of AFMs offering significant cost reduction and ease of use allowing widespread use of AFM techniques in state of the art research, development, and manufacturing.
Phase II
Contract Number: ----------Start Date: 00/00/00 Completed: 00/00/00