Previously dba X-ray Instrumentation Associates, XIA LLC is organized around advanced digital data acquisition and processing systems for x-ray, gamma-ray, and other radiation detector applications in university research, national laboratories and industry with instruments falling broadly into three categories â supporting x-ray detectors, gamma-ray detectors, and ultra-low background counting. Our DXP x-ray detector electronics span the spectrum from low cost OEM cards for handheld and benchtop applications to PXI and standalone modules for ultra high rate counting at synchrotrons and elsewhere. The firm's work is anchored in XIA in R&D targeting advance product research, and contract R&D: an example is a 32 channel processor that achieves 1-2 eV energy resolution for 600 eV x-rays with superconducting tunnel junction (STJ) array detectors. The combination of the digital signal processor (DSP) and field programmable gate array (FPGA) has revolutionized the field of x-ray and gamma-ray spectroscopy. XIA sought to have DSP and FPGA work in concert, with the FPGA carrying out pulse detection, filtering and pileup inspection tasks while the DSP executed higher level post processing algorithms to produce the fastest and most powerful spectrometers on the market subsequently adding timing, coincidence inspection and pulse shape analysis capabilities enabling the firm's instruments to continue to providing best-in-class performance across various commercial and experimental applications. XIA's CORE competencies: Very high speed digital processing using a combination of FPGA and DSP technologies Scalable solutions for a wide range of radiation detection, timing and spectroscopy applications â from battery powered handhelds to large industrial or research installations Cost effective customizations for unusual applications or integration into existing data collection systems Customized OEM processors, including specialized algorithm development Collaborative projects to develop specialized detector support electronics Pulse shape analysis and its application to real time particle identification Ultra low background radiation detecti
