
Xallent LLC Profile last edited on: 1/8/2020
CAGE: 6Z7T4
UEI: VTJBCD7QGNU6
Business Identifier: Testing solutions: nanoscale characterization of semiconductor devices, energy materials and thin film characterization Is this YOUR Company?
Ensure accuracy and completeness of YOUR Company Profile by completing the brief Survey Instrument attached
Do you know about this Awardees?
Let us encourage you to provide any data which would enhance the completeness of this firm's profile.
Location Information
Location: Single
Congr. District: 23
County: Tompkins
Congr. District: 23
County: Tompkins
Public Profile
With current focus of commercializing a multiple-tip scanning probe technology developed at Cornell University, Xallent, LLC is developing testing solutions to support nanoscale characterization of semiconductor devices, energy materials and thin film characterization. Currently focused on integrated circuit forensics - national security area many of Xallents products are designed to enable the semiconductor industry to identify faults in the early stages of fabrication: major cost savings. Characterization and testing of semiconductor materials and devices is fraught with challenges: heavy demand, price pressure and rapid miniaturization With device costs majorly reduced, the cost of testing is now a major driver of transistor cost. When applied to structures <100 nm, conventional characterization and test methods are increasingly ineffective: challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to doping, line width variations. Many of these are at length scales invisible to traditional scanning electron microscope and optical-based tools, requiring novel approaches.
Extent of SBIR involvement
Synopsis: Awardee Business Condition
Employee Range
5-9Revenue Range
.5M-1MVC funded?
NoPublic/Private
Privately HeldStock Info
----IP Holdings
1-4Awards Distribution by Agency
Most Recent SBIR Projects
Year | Phase | Agency | Total Amount | |
---|---|---|---|---|
2022 | 2 | DOC | $506,500 | |
Project Title: Nano-Electro-Mechanical-Systems Probe for Thin Film Materials Characterization | ||||
2020 | 2 | NSF | $1,277,591 | |
Project Title: Integrated Nano-Electro-Mechanical Scanning Probes for Failure Analysis of the 10-Nanometer Node and Beyond | ||||
2019 | 1 | DOC | $106,500 | |
Project Title: Nanomachine Device for Semiconductor Process Control Monitoring | ||||
2019 | 1 | Army | $107,995 | |
Project Title: Small Pitch Cryogenic Probe Card | ||||
2018 | 1 | DARPA | $229,930 | |
Project Title: Processes for Fabrication of Atomically Precise Strongly Correlated Materials |
Key People / Management
Kwame Amponsah -- Founder and CEO