The imaging techniques developed by NanoElectronic Imaging, Inc's (NEI) reveal what are otherwise invisible electronic and thermal structure in micro- and nano-electronic devices. Transmission electron microscope (TEM) is used in the semiconductor industry for quality control of the ten billions of components across millions of products. However, TEM can only see physical structures effectively the system is blind to the electronic and thermal structures that govern device operation. The Scanning TEM Electron Beam-Induced Current (STEM EBIC) imaging system developed by NEI can quantitatively map temperature, conductivity, potential, electric field, and work function. There exist few alternatives able to map any of these properties at high resolution, and none have the capcity to map them all. Standard TEM imaging identifies only the location of the atoms in an electronic device while NEIs technology shows what they are doing.
