J A Woollam began as a spin-off out of the University of Nebraska and has retained strong and close ties to that institution. The firm focuses to spectroscopic ellipsometry with particular expertise in use of that capability in thin film characterization. J.A. Woollam Co. Inc. manufactures spectroscopic ellipsometers for non-destructive thin film and bulk material characterization. Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characterization of all types of materials: dielectrics, semiconductors, metals, organics, and more. The firms offers ellipsometers covering a spectral range to meet any need (from the vacuum UV to the far IR). The ellipsometers come with many upgrade options: automated sample translation, variable temperature (heating or cooling), focusing optics, liquid cells, etc.
