
An automated software for dimensional analysis of nanomaterials from electron microscopy imagesAward last edited on: 00/00/00
Sponsored Program
SBIRAwarding Agency
NSFTotal Award Amount
$149,681Award Phase
1Solicitation Topic Code
-----Principal Investigator
Jeffrey WhalenCompany Information
FullScaleNANO Inc
400 Capital Circle SE
Tallahassee, FL 32301
Tallahassee, FL 32301
(850) 321-5540 |
info@fullscalenano.com |
www.fullscalenano.com |
Location: Single
Congr. District: 05
County: Leon
Congr. District: 05
County: Leon
Phase I
Contract Number: ----------Start Date: ---- Completed: ----
Phase I year
2013Phase I Amount
$149,681The broader impact/commercial potential of this project is its facilitation of the emerging nanotechnology industry by saving time and money and reducing errors during dimensional analysis of nanomaterials. The commercial impact to industry will be greater profitability for nanomaterial manufacturers and nanotechnology device producers, which will use the software package to conduct rigorous but cost-effective dimensional quality control on their products. Additionally, the proposed software package will foster trust along the nanomaterials supply chain by establishing the first universal standardized dimensional analysis procedure. The target market for the final software also includes nanotechnology research facilities, where an educational impact will result from the use of the proposed software by the next generation of nanotechnology scientists and engineers. Regulation of nanomaterials and nanotechnology will also benefit from the traceability and reliability afforded by this software, and this will facilitate greater public acceptance and trust of nanotechnology, stemming from improved nanomaterials quality control.
Phase II
Contract Number: ----------Start Date: ---- Completed: ----