SBIR-STTR Award

Ion implantation-free SiC device fabrication technology based on low-temperature selective epitaxial growth
Award last edited on: 1/29/2014

Sponsored Program
SBIR
Awarding Agency
NSF
Total Award Amount
$99,996
Award Phase
1
Solicitation Topic Code
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Principal Investigator
Galyna Melnychuk

Company Information

BarSiC Semiconductors LLC

209 Brook Avenue
Starkville, MS 39759
   (662) 323-9854
   galyna@barsicsemi.com
   www.barsicsemi.com
Location: Single
Congr. District: 03
County: Oktibbeha

Phase I

Contract Number: ----------
Start Date: ----    Completed: ----
Phase I year
2008
Phase I Amount
$99,996
This Small Business Innovative Research Phase I project aims at developing new semiconductor device processing technology for SiC electronics. The new method is based on low-temperature selective epitaxial growth of SiC (LTSEG) of SiC. The technology promises high values of doping, especially for p-type doping that is problematic in SiC. Another advantage is the development of a self-aligned fabrication technique for the emerging market of SiC power integrated circuits. Self-aligned device fabrication for SiC is in the embryonic stage. Efforts to develop new fabrication technologies in Japan and Europe are growing, which may put the U.S. SiC industry significantly behind in developing cost-efficient SiC electronics. In this respect, the novel device fabrication method offers a possibility of strong competitive advantage.

Phase II

Contract Number: ----------
Start Date: ----    Completed: ----
Phase II year
----
Phase II Amount
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