SBIR-STTR Award

Electronic device aging creates substantial problems for government and commercial users of technology. As electronics evolve to be more complex decade-old legacy approaches to electronics aging assessment are no longer adequate. The internal functional state of Integrated Circuits (ICs) and other piece parts are causally related to the Radio Frequency (RF) emission signatures that all electronics naturally emit. Advanced sensors and data processing techniques provide a unique opportunity to make dramatic advances in this field. The Advanced Diagnostics of Electronic Devices (ADEC) ultra-sensitive RF emissions collection system that has been shown to have adequate sensitivity to measure aging effects. ADEC will be used to develop the necessary techniques and methodology to overcome these deficiencies and develop an Aging and Reliability Module (ARM) for the assessment of aging effects in electronic devices.

Benefit:
This effort will support the Navy by certifying and qualifying the ARM system for Naval use. The accelerated age assessment evaluation test method can be adopted for use in evaluating electronic piece parts currently deployed in DOD systems. The technology has commercial benefit for high reliability industries such as the automotive, aviation, nuclear and infrastructure industries. An example is the use in automotive industry electronics where such devices could be used to determine when a car begins to have aging problems. The commercial airline industry to help diagnose the degradation of aging electronics. Other areas include embedding smart chips either within appliances, smart phones, security systems, and commercial transportation systems to monitor their health. With the miniaturization of microchips, we are seeing the utilization of these devices in humans as well as in electronics to monitor the vital signs and to detect changes rapidly and invasively in an affordable way. Radio Frequency (RF) emission analysis is a new approach that resolves these limitations and deficiencies. RF emissions analysis provide unique and differentiating measurement driven insight into the aging mechanics of electronic piece parts board level parts actionable Condition Based Maintenance (CBM) and Remaining Useful Life (RUL) prognostication.

Keywords:
, , aging effects, ADEC, remaining useful life (RUL), Advanced Diagnostics of Electronic Devices

The U.S. Navys Strategic Systems Programs (SSP) operates some of the most technologically sophisticated weapon systems ever produced. Those systems are 100% dependent on modern advanced electronics. There are major challenges in available reliability assessment approaches to address the reliability of modern electronic devices used in these systems. SSPs SBIR solicitation sought innovative advanced technology with real-time capability to support measuring aging effects and predictive degradation analysis on electronic piece parts. This Phase II proposal leverages Nokomis existing Advanced Diagnostics of Electronic Components (ADEC) system and focuses on the development of an Aging and Reliability Module (ARM). ARM will deliver unique and unparalleled capability to detect aging via radio frequency (RF) signature changes that correlate directly to aging mechanisms in support of SSP real-time component reliability assessment needs. The Nokomis developed TRL 9 ultra-sensitive ADEC system measures degradation of electronic components through assessment of RF spectrum metrics. ADECs sensitivity of -170 dBm is uniquely capable of detecting small signature changes that provide breakthrough capabilities in this area. ADECs modular software architecture facilitates a seamless integration of the ARM for SSP. The ADEC-ARM capability will provide a framework for: Real-time radiation hardness degradation assessments Assessments of aging on the piece part and board level Actionable Condition Based Maintenance (CBM) Remaining Useful Life (RUL) prognostication

Benefit:
As the demand for aging, reliability, and predictive electronic testing continues to increase, ARM will benefit from a dramatically growing market. Nokomis strong technology foundation, 19 years of business experience and demonstrated commercialization acumen will be leveraged to ensure successful commercialization of ARM. Nokomis employs a dedicated business development team in both the commercial and military sectors. Assessment of microelectronic reliability continues to be a crucial necessity in both commercial and military markets. As the demand for predictive electronic testing continues to increase, Nokomis will take advantage of the opportunity to prevent aged, degraded, and anomalous parts from impacting the operational readiness of electronic systems. Effective aging, reliability and RUL prognostics is a requirement for Condition Based Maintenance (CBM) initiatives within the Navy and across the DoD. Nokomis ARM effort is tailored to satisfy customer desired improvements to maintenance, production floor operations, and project flow including the development of degradation modeling to enable prescriptive maintenance in support of CBM. Nokomis will pursue opportunities for commercialization of the ARM technology. Beyond the U.S. Navy, Nokomis will utilize existing relationships within the entirety of the DOD to promote the technology to additional organizations that will also benefit, for example, the U.S Air Force, Space Force, and the Missile Defense Agency, all of whom have similar concerns with microelectronic performance. Within private sector markets, our planned strategy will focus on the market leading U.S. based companies including Lockheed Martin, Raytheon, L-3 Harris, Northrop Grumman and General Dynamics. Additional outreach targets include electric vehicle manufacturers such as Tesla and Rivian.

Keywords:
aging effects, Aging and Reliability Module (ARM), Unintended RF Emissions from Microelectronics, RUL Prognostication, Condition Based Maintenance (CBM), remaining useful life (RUL), Evaluation of Radiation Hardened Microelectronics., ADEC