SBIR-STTR Award

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Feasibility of Inspecting High-Z Material Coatings Using X-Ray Or Gamma-Ray Techniques
Award last edited on: 12/18/2014

Sponsored Program
SBIR
Awarding Agency
DOD : Navy
Total Award Amount
$490,842
Award Phase
2
Solicitation Topic Code
N84-071
Principal Investigator
Nand K Gupta

Company Information

Bio-Dynamics R&D Corporation

1000 Willagillespie Road Suite 200
Eugene, OR 97401
   (503) 343-8400
   N/A
   N/A
Location: Single
Congr. District: 04
County: Lane

Phase I

Contract Number: N/A
Start Date: 00/00/00    Completed: 00/00/00
Phase I year
1984
Phase I Amount
$49,632
We propose to evaluate transmission, fluorescence, and backscattering techniques of x-rays or gamma-rays to determine defects in high-z coatings on low-z substrates. The proposal includes x-ray spectral analysis, followed by experimental measurements on actual samples, to determine optimum design parameters and the minimum size of defect that can be detected. Under favorable experimental results, both the parameters and the operating concept for an optimum instrument can be defined at the end of phase i, for the eventual fabrication of a prototype in phase ii we propose to evaluate transmission, fluorescence, and backscattering techniques of x-rays or gamma-rays to determine defects in high-z coatings on low-z substrates. The proposal includes x-ray spectral analysis, followed by experimental measurements on actual samples, to determine optimum design parameters and the minimum size of defect that can be detected. Under favorable experimental results, both the parameters and the operating concept for an optimum instrument can be defined at the end of Phase I, for the eventual fabrication of a prototype in Phase II

Phase II

Contract Number: N/A
Start Date: 9/10/1986    Completed: 9/10/1988
Phase II year
1986
Phase II Amount
$441,210
We propose to evaluate transmission, fluorescence, and backscattering techniques of x-rays or gamma-rays to determine defects in high-z coatings on low-z substrates. The proposal includes x-ray spectral analysis, followed by experimental measurements on actual samples, to determine optimum design parameters and the minimum size of defect that can be detected. Under favorable experimental results, both the parameters and the operating concept for an optimum instrument can be defined at the end of phase i, for the eventual fabrication of a prototype in phase ii we propose to evaluate transmission, fluorescence, and backscattering techniques of x-rays or gamma-rays to determine defects in high-z coatings on low-z substrates. The proposal includes x-ray spectral analysis, followed by experimental measurements on actual samples, to determine optimum design parameters and the minimum size of defect that can be detected. Under favorable experimental results, both the parameters and the operating concept for an optimum instrument can be defined at the end of Phase I, for the eventual fabrication of a prototype in Phase II