Nokomis is proposing to use Radio Frequency (RF) technology to characterize the effects of different radiation environments on electronic components. Nokomis has created and matured an ultra-sensitive RF sensor, the Advanced Diagnostics of Electronic Components (ADEC) system to characterize electronics via Electromagnetic (EM) emissions. ADEC functions as a multifaceted tool, specifically to characterize and identify the emission signature related to a specific electronic device or system, as well as the state or functionality of the component. In this proposal Nokomis will use ADEC to detect differences in electronic components based on the type of radiation and total ionizing dose (TID). By classifying the characteristics of the EM emissions Nokomis will correlate RF signature characteristics with radiation exposure effects. Approved for Public Release | 21-MDA-11013 (19 Nov 21)
