This document outlines the activities proposed by STI Electronics Inc. to develop cleanliness requirements on a complex military electronics assembly using Real Time Surface Insulation Resistance (SIR). Real Time SIR testing under components allows for the non-destructive, real time data acquisition necessary to validate cleanliness in a production environment. This proposal outlines hardware configurations and testing performed to legitimize the short- and long- term reliability of Real Time SIR testing. It concentrates primarily on establishing the viability of non-destructively/non-intrusively quantifying ionic contamination levels beneath components to meet cleanliness requirements. If approved, this would allow for a wide range of solder fluxes, component packages, and manufacturing processes to be evaluated as they relate to meeting the newly proposed cleanliness standards. Approved for Public Release 15-MDA-8169 (20 March 15)
