SBIR-STTR Award

LIT will develop Silicon Modification Sensor (SMS) circuitry that is capable of detecting FIB processing or unauthorized changes to Integrated Circuit (IC) silicon. The SMS circuits will produce key material to be used to decipher CPI data and software. The SMS system is intended to operate as a part of the LIT Product Authentication Sensor System™ (PASS™). The detection of modification by the SMS produces an invalid key. In the complete AT solution, the SMS circuits provide an additional layer of protection in case all other security methods fail or are compromised. In Phase I, LIT will develop Silicon Modification Sensor circuits in FPGAs and test against simulated FIB attacks. In Phase II, LIT will test SMS against actual FIB processing.

Keywords:
Focused Ion Beam (FIB), FIB Processing, FIB Attack, Security Sensors, Silicon Modification Sensor, Programmable Logic Devices, Field Programmable Logic Devices

The goal of this research is to develop Unclonable Functions that will generate reliable cryptographic keys based on system characteristics. In the event of a reverse engineering attack, the encrypted configuration files, programs, and data will not be deciphered because the attack modifies the cryptographic keys. LIT?s goal is to develop Unclonable Functions that may be used in FPGAs or ASICs to allow protection for all types of silicon devices. These Unclonable Functions are sensitive to specific reverse engineering attacks including package modification and silicon modification.

Keywords:
Reverse Engineering, Unclonable Function, Tamper Detection, Tamper Response, System Security, Focused Ion Beam, Silicon Modification, Ic Packaging/Package Modification