SBIR-STTR Award

Off c-Axis Bulk Crystal Growth of Silicon Carbide
Award last edited on: 6/3/2008

Sponsored Program
SBIR
Awarding Agency
DOD : MDA
Total Award Amount
$1,065,000
Award Phase
2
Solicitation Topic Code
BMDO01-014
Principal Investigator
Yuri Khlebnikov

Company Information

Band Gap Technologies Inc

1428 Taylor Street
Columbia, SC 29201
   (803) 794-3125
   brownm@bandgap.com
   www.bandgap.com
Location: Single
Congr. District: 06
County: Richland

Phase I

Contract Number: ----------
Start Date: ----    Completed: ----
Phase I year
2001
Phase I Amount
$65,002
This Phase I program is aimed at demonstrating the principle of off c-axis boule growth of 4H-SiC. In Phase I, using off-axis SiC seeds, we will demonstrate the growth of 4H-n SiC boules~15 mm long. Also in Phase I, we will slice the off-axis boules into wafers, lap and polish them, and perform structural and electrical characterization of the wafers. Comparisons will be made with on-axis wafers for micropipe and planar defect densities and their distributions. The off-axis grown wafers are expected to offer significant advantages for device processing and fabrication. In Phase II, improvements will be made to the growth process, and we will demonstrate the production of commercially feasible, large diameter off-axis 4H-n SiC wafers with reduced defect density.

Phase II

Contract Number: ----------
Start Date: ----    Completed: ----
Phase II year
2002
Phase II Amount
$999,998
The development of a process to produce bulk silicon carbide (SiC) boules with alternate crystallographic orientations, specifically the a-orientation, which is perpendicular to the normally-grown c-orientation crystal, offers significant improvements in the SiC semiconductor electronic properties. Specifically, the electron mobility will increase by a factor of five for 4H-SiC, and the thermal conductivity will improve by a factor of 1.25. In addition to increments in the above key material properties, the nature of defects present in the a-face material are expected to be markedly different from those in c-face wafers; for example, the device-killing micropipes are expected to be absent in a-face wafers. Further, the availability of a-face wafers produced by a bulk growth process will significantly add to the versatility of SiC as a high temperature and high power electronic material. The improvements in material properties are expected to result in SiC-based devices with greatly improved characteristics and performance. In the Phase I SBIR program, the feasibility of growing SiC boules seeded from an a-orientation wafer was convincingly demonstrated. The objective of the proposed Phase II program is to take the Phase I demonstration of this radical approach to the systematic development of a process to produce a -orientation bulk crystals of approximately 35 mm in diameter and to improve the material quality. Further, in Phase II, the a-face growth process will be optimized for cost effectiveness, yield, and crystal quality, especially a significant improvement in polytype homogeneity, to develop a commercial product. Further, the wafers derived from the boules will be characterized for micropipes and other defects.

Keywords:
Silicon Carbide, Sublimation, High Power Electronics , Sic, Micropipes, High Power Switching