SBIR-STTR Award

A Multi-channel Radiation-tolerant, Low-power, High-speed, and Resolution Analog-to-Digital Converter for Nuclear Physics Detectors
Award last edited on: 10/12/2018

Sponsored Program
STTR
Awarding Agency
DOE
Total Award Amount
$1,150,000
Award Phase
2
Solicitation Topic Code
28b
Principal Investigator
Ping Ping Gui

Company Information

TallannQuest LLC (AKA: Apogee Semiconductor Inc)

13140 Coit Road Suite 212
Garland, TX 75240
   (214) 926-7576
   imelda@tallannquest.com
   www.tallannquest.com

Research Institution

Southern Methodist University

Phase I

Contract Number: DE-SC0018442
Start Date: 4/9/2018    Completed: 1/8/2019
Phase I year
2018
Phase I Amount
$150,000
Cost-effective and power-efficient radiation tolerant semiconductors are needed in various harsh environments, such as particle detectors, communication satellites, high-altitude avionics and medical imagining equipment. These include amplifiers, voltage regulators, analog-to-digital converters (ADCs) and digital logic circuitry. However, radiation-tolerant high-speed ADCs currently cost more than $30, 000 per channel and have a high power consumption. A novel high-speed radiation tolerant ADC is proposed, leveraging TallannQuestÂ’s patented rad-hard-by- design technology, offering significantly lower power consumption and smaller size than what is offered by the current state of the art. This will result in an order of magnitude lower cost per channel, and will allow for greater integration of multiple ADCs into a single integrated circuit (IC). Such integrated solution, which may represent an entire analog front-end for detectors used in nuclear physics experiments, as well is in other applications (e.g., satellite communications and medical imaging equipment), is an anticipated outcome from the extension of this Phase 1 research project into a Phase 2 project.

Phase II

Contract Number: DE-SC0018442
Start Date: 5/28/2019    Completed: 5/27/2021
Phase II year
2019
Phase II Amount
$1,000,000
Cost-effective and power-efficient radiation tolerant semiconductors are needed in various harsh environments, such as particle detectors, communication satellites, high-altitude avionics and medical imagining equipment. These include amplifiers, voltage regulators, analog-to-digital converters (ADCs) and digital logic circuitry. However, radiation-tolerant high-speed ADCs currently cost more than $30,000 per channel and have high power consumption. A novel multi-channel, high-speed radiation tolerant ADC is proposed, leveraging Apogee SemiconductorÂ’s patented rad-hard-by-design technology, offering significantly lower power consumption and smaller size than what is offered by the current state of the art. This will result in an order of magnitude lower cost per channel, and will allow for greater integration of multiple ADCs into a single integrated circuit (IC). During the course of the Phase I, we have conducted an extensive study, analyses, circuit design, simulations, chip fabrication and on-silicon measurements to demonstrate the feasibility of the approaches and techniques proposed in the Phase-I proposal. All the tasks outlined for Phase I have been successfully completed. During Phase II, a radiation-tolerant 16-channel, 1 Gigabit-per-second 12-bit ADC will be designed and fabricated using a state-of-the-art 28nm CMOS silicon fabrication process. The resulting silicon will be radiation-tested to ensure compliance with nuclear physics applications, thereby also validating its tolerance to the lower radiation levels experienced in aerospace and medical imaging environments. Commercial applications and other

Benefits:
The outcome of the Phase II project will be a low-cost integrated solution that will not only address the DoE needs, but will also enable large constellations of small communication satellites to provide low- latency and high-speed, cost-effective internet access to underserved populations. It will also provide a cost-effective solution for medical imaging equipment that will allow wider public access to it, as well as reduced exposure of patients to harmful x-ray radiation.