SBIR-STTR Award

An Optical Imaging System to Characterize Mechanical Deformation at Microscopic Length Scale
Award last edited on: 12/23/2020

Sponsored Program
SBIR
Awarding Agency
DOC : NIST
Total Award Amount
$99,999
Award Phase
1
Solicitation Topic Code
9.0
Principal Investigator
Ajit Achuthan

Company Information

Additive Manufacturing Innovations LLC (AKA: AM-Innov)

65 Main Sreet Suite 3008
Potsdam, NY 13676
   (228) 813-6209
   N/A
   www.aminnov.com
Location: Single
Congr. District: 21
County: St. Lawrence

Phase I

Contract Number: 70NANB20H128
Start Date: 00/00/00    Completed: 00/00/00
Phase I year
2020
Phase I Amount
$99,999
Additive Manufacturing Innovations LLC (AM-Innov) in collaboration with Clarkson University and Naval Research Laboratory (NRL) proposes a new optical imaging system to characterize microscopic deformation of materials. The system, named as a Mechanical Testing at Microscale system (MT@micro), uses a micro-tensile testing device to mechanically load the specimen uniaxially and an optical imaging platform to capture high resolution, in-situ images of the evolution of heterogeneous deformation on the specimen surface for a large global strain. Such an enormousadvancement in the characterization capabilities could be achieved by addressing the fundamental challenges of the state-of-the-art technology, primarily the narrow depth of field of the microscope, large rigid body motion of the field of view, and lack of a data processing algorithms to extract critical engineering data from a large number of image frames. MT@micro will have three innovative solutions to address these challenges: 1) a smart imaging subsystem, 2) a features detection and tracking subsystem, and 3) a material modeling subsystem. Solutions will be developedfollowing an interdisciplinary approach. The proposed system is expected to advance the mechanical characterization at microscale with an optical imaging technique into a robust material design and development tool.

Phase II

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Start Date: 00/00/00    Completed: 00/00/00
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