SBIR-STTR Award

Super-Precision Capacitance Bridge
Award last edited on: 10/11/2004

Sponsored Program
SBIR
Awarding Agency
DOC : NIST
Total Award Amount
$375,000
Award Phase
2
Solicitation Topic Code
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Principal Investigator
Carl Andeen

Company Information

Andeen Hagerling Inc

31200 Bainbridge Road
Cleveland, OH 44139
   (440) 349-0370
   info@andeen-hagerling.com
   www.andeen-hagerling.com
Location: Single
Congr. District: 14
County: 

Phase I

Contract Number: N/A
Start Date: 00/00/00    Completed: 00/00/00
Phase I year
2003
Phase I Amount
$75,000
NIST desires to develop a standard of pressure in the range of 0.3Mpa to 10 Mpa based on measurements of the dielectric constants of gaseous helium and argon. This requires capacitance measurements having a better linearity than can be made with any currently available product. It is proposed that the design of what is currently the most precise commercial capacitance bridge be modified to improve its linearity by at least an order of magnitude. Resolution, stability and temperature coefficient are also to be improved

Phase II

Contract Number: 9.02.03
Start Date: 00/00/00    Completed: 00/00/00
Phase II year
2004
Phase II Amount
$300,000
NIST desires to develop a standard of pressure in the range 0.3 MPa to 10 MPa based on measurements of the dielectric constants of gaseous helium and argon. This requires capacitance measurements having a better linearity than can be made with any currently available product. It is proposed that the design of the currently most precise commercial capacitance bridge be modified to improve its linearity by at least an order of magnitude. Resolution, stability and temperature coefficient are also to be improved. COMMERCIAL APPLICATIONS: A Super-Precision Capacitance Bridge will be useful for: making high pressure measurements, the development of more precise sensors, extremely precise capacitance calibrations, quantum hall effect measurements, low-temperature capacitance thermometry and any research where a physical or material property can be determined directly or indirectly by studying very small changes in very high quality capacitance measurement data