A nondestructive technique is proposed for the on-line determination of grain size in polycrystalline materials. The method correlates fluctuations in intensity of x-rays diffracted from various crystallographic planes in the material to the grain size. Through the use of position-sensitive x-ray detectors and high-speed digital computers and data acquisition systems, it is possible to gather and interpret sufficient data enabling the technique to be used on-line for material processing. The method can be used on both stationary samples and moving materials (elg., rolled sheet). The procedure is applicable in a wide range of polycrystalline materials, including metals, alloys, ceramics, and sintered materials in a variety of shapes.