SBIR-STTR Award

Development of Ga2O3 Epitaxial Layers and Heterostructures for Power Device Applications
Award last edited on: 8/22/2018

Sponsored Program
SBIR
Awarding Agency
DOD : AF
Total Award Amount
$899,918
Award Phase
2
Solicitation Topic Code
AF171-018
Principal Investigator
Andrei Osinsky

Company Information

Agnitron Technology Inc

6595 Edenvale Boulevard Suite 180
Eden Prairie, MN 55346
   (952) 937-7505
   sales@agnitron.com
   www.agnitron.com
Location: Single
Congr. District: 03
County: Hennepin

Phase I

Contract Number: FA9550-17-P-0029
Start Date: 00/00/00    Completed: 00/00/00
Phase I year
2017
Phase I Amount
$149,970
This Phase I program sets out to capitalize on recent advances in epitaxial growth of -Ga2O3 which have the potential to significantly improve upon the performance of currently available power electronics devices. Specifically, -Ga2O3, offers fundamental properties such as its ability to withstand very large electric fields that suggest its use as a power electronics material will lead to device performance beyond even that of SiC and GaN. We propose to determine the growth parameters that yield high quality, doped -Ga2O3 epitaxial layers and (AlxGa1-x)2O3/-Ga2O3 epitaxial heterostructures. That is, MOSFET and HEMT structures. For this program we have assembled a team of renowned scientists with expertise in the growth and characterization of semiconductor oxides.

Phase II

Contract Number: FA9550-19-C-0030
Start Date: 00/00/00    Completed: 00/00/00
Phase II year
2019
Phase II Amount
$749,948
This Phase II program sets out to capitalize on recent advances in epitaxial growth of -Ga2O3 which have the potential to significantly improve upon the performance of currently available power electronics devices. Specifically, -Ga2O3, offers fundamental properties such as its ability to withstand very large electric fields that suggest its use as a power electronics material will lead to device performance beyond even that of SiC and GaN. We propose to determine the growth parameters that yield high quality, doped -Ga2O3 epitaxial layers and (AlxGa1-x)2O3/-Ga2O3 epitaxial heterostructures on bulk (010) -Ga2O3 substrates. These structures will be optimized to enhance the properties of the MOSFET and HEMT (also known as MODFET) devices that can be fabricated from them. For this program we have assembled a team of renowned scientists with expertise in the growth and characterization of semiconductor oxides as well as device fabrication.