SBIR-STTR Award

This proposal develops a new method to accurately identify counterfeit electronic parts ranging from passive components to advanced microprocessors and full circuit boards.The method uses an intrinsic material security approach coupled with a physically uncloneable function (PUF) that is not added to the device fabrication protocol.The hyperspectral method combines transient dielectric and IR emission responses to produce a unique and uncloneable signature from the device. The method can provide a rapid and reliable approach for forensic investigation and identification of counterfeit electronic components.