
Low Cost Universal Reliability System On-A-Chip for Multi-Channel CharacterizationAward last edited on: 10/8/2012
Sponsored Program
SBIRAwarding Agency
DOD : AFTotal Award Amount
$149,091Award Phase
1Solicitation Topic Code
AF121-166Principal Investigator
Roland W ShawCompany Information
Accel-RF Corporation (AKA: Accel-RF Instruments Corporation)
Location: Single
Congr. District: 52
County: San Diego
Congr. District: 52
County: San Diego
Phase I
Contract Number: ----------Start Date: ---- Completed: ----
Phase I year
2012Phase I Amount
$149,091Benefit:
Development of low cost Power Amplifier Module reliability test system. Applicable to RF-HTOL and performance degradation assessment. Turn-key, automated accelerated life test system platform for technology and device reliability assessment.
Keywords:
Low Cost Rf Reliability Test System, Gan Reliability,
Phase II
Contract Number: ----------Start Date: ---- Completed: ----