SBIR-STTR Award

Short Pulse Radio Frequency (RF) Field Measurement System
Award last edited on: 11/19/2010

Sponsored Program
SBIR
Awarding Agency
DOD : AF
Total Award Amount
$849,959
Award Phase
2
Solicitation Topic Code
AF093-029
Principal Investigator
Jack Thiesen

Company Information

Opteos Inc

775 Technology Drive Suite 200
Ann Arbor, MI 48108
   (734) 929-3333
   info@opteos.us
   www.opteos.us
Location: Single
Congr. District: 12
County: Washtenaw

Phase I

Contract Number: ----------
Start Date: ----    Completed: ----
Phase I year
2010
Phase I Amount
$99,997
Opteos Inc. is responding to an Air Force request to develop a rugged field-portable multi-channel measurement system with non-perturbing probes capable of measuring and displaying real time waveforms from RF pulses with frequency components from 3 kHz to 100 GHz and peak field strengths of 2 MV/m or 5 kA/m with pulse widths as short as 100 picoseconds. The proposed system will build upon Opteos expertise in real time electrooptic E-field measurement systems and can support up to 48 deployed probes and will be able measure electrics fields as low as 20V/m. We believe that this system represent a fundamental breakthrough in high-field strength measurement capabilities.

Benefit:
The proposed real-time field detection probe will have a number of applications in EMC/EMI measurement and high power microwave weapon assessment.

Keywords:
Rf Pulse, Probe, Detection, Electric And Magnetic Fields, Waveform, Non-Intrusive Measurement

Phase II

Contract Number: ----------
Start Date: ----    Completed: ----
Phase II year
2011
Phase II Amount
$749,962
Opteos Inc. is proposing a new approach to the measurement of electric fields based on the electrooptics principles. This system promises an extremely high bandwidth of operation, 50GHz to 100GHz, a wide dynamic range up to 60dB, and high accuracy better than 1% full scale. The system is modular with partitioning concepts that allow for inexpensive expansion and easy maintenance. The proposed Phase II effort will involve development of a new architecture for the electrooptic probe, which will feature high sensitivity and better manfacturability.

Benefit:
The proposed real time field probing system will have a variety of applications in the test and evaluation of high power microwave (HPM) systems, high speed digital, electronic and RF circuits and EMI/EMC testing.

Keywords:
Probe, Electrooptic, Electric Field, Measurement, High Power, Sensitivity