IGI PROPOSES AN INVESTIGATION INTO USING THE GENERATION AND CONTROL OF SECONDARY ELECTRONS FROM ELEMENTS ON A PRINTED CIRCUIT BOARD AS A DIAGNOSTIC TOOL FOR TESTING AND DETERMINING FAILURES IN PRINTED CIRCUIT BOARD COMPONENTS. THIS PROPOSED WORK CONSISTS OF INVESTIGATING VARIOUS TEST METHODOLOGIES USING A MODIFIED IGI ELECTRON BEAM IMAGE RECORDER AS A TEST BED. IN ADDITION, METHODS BY WHICH THE NECESSARY INTELLIGENCE REQUIRED TO PROPERLY ADDRESS THE ELECTRON BEAM ONTO THE PCB CAN BE OBTAINED, AS WELL AS METHODS OF GENERATING ACCURATE INTERPRETIVE SOFTWARE FOR THE DIAGNOSIS OF FAILURES ON THE BOARDS,WILL BE INVESTIGATED.BY ADAPTING IGI'S ELECTRON BEAM RECORDER TECHNOLOGY, PRINTED CIRCUIT BOARDS AS LARGE AS 18" X 18" CAN BE ADDRESSED BY THE ELECTRON BEAM WITHOUT THE NECESSITY OF MOVING THE BOARD. USING DUAL BEAMS, THIS ADDRESSABILITY, ALONG WITH IGI'S ABILITY TO MAINTAIN A SPOT SIZE OF UNDER 0.002" OVER AN 18" X 18" FORMAT PERMITS TESTING OF BOTH SIDES OF A PRINTED CIRCUIT BOARD SIMULTANEOUSLY. THIS TECHNOLOGY CAN EASILY BE ADAPTED TO THE DEVELOPMENT OF A DOUBLE SIDE ELECTRON BEAM TESTER THAT WILL MEET THE REQUIREMENTS OF BOTH PRESENT AND FUTURE PRINTED CIRCUIT BOARD TESTING.
Keywords: Electron Beam, Contactless, Dual Sided, Interpretive Diagnostic Software, Pcb Testing, Large Format, Fixtureless, Fault Detection
