Today's complex DoD and commercial satellite systems require a sophisticated test and fault monitoring approach for enhanced telemetry. Hence, an embedded test processor capable of monitoring faults in real-time and relaying the information to the satellite's control processor is needed. In addition, a smart processor capable of performing built-in test upon command would provide critical information necessary to isolate faulty units or circuitry within the spacecraft. This same technology is required in high-end consumer commercial hardware during manufacturing and in-field test. The convergence to systems-on-chip accelerates the need for a "smart" embedded processor capable of providing test access to complex blocks of logic now embedded within a single ASIC. The Advanced Embedded Test Processor satisfies the DoD, commercial satellite, and consumer market need for a programmable, real-time fault monitoring and built-in-test controller targeted for implementation in VHDL
