SBIR-STTR Award

Missile Guidance Electronics NPBW Vulnerability Study
Award last edited on: 4/9/2014

Sponsored Program
SBIR
Awarding Agency
DOD : AF
Total Award Amount
$552,235
Award Phase
2
Solicitation Topic Code
AF84-282
Principal Investigator
Bruce Lawton

Company Information

Questron Corporation

10220 Sorrento Valley Road
San Diego, CA 92121
   (619) 450-1701
   N/A
   N/A
Location: Single
Congr. District: 52
County: San Diego

Phase I

Contract Number: N/A
Start Date: 00/00/00    Completed: 00/00/00
Phase I year
1984
Phase I Amount
$52,235
Recent initiatives such as the work of the defensive technologies study team ("fletcher summer study") have emphasized ballistic missile defense employing directed energy weapon (DEW). Possible deployment of such weapons by adversaries of the US. Makes mandatory the understanding of w. vulnerabilities of US Ballistic missiles of the spectrum of possible threats. This study is the first Phase In evaluating all classes of vulnerabilities (electronics structural failure propellant ignition, etc.) To the range of dew threats (conventional and x-ray lasers and particle beams). The effort consists of categorizing classes of missile components (missile system)-subsystems and pieceparts); identifying the various dew threats, range of threat levels and threat location vs. Likely missile mission "scenarios"; establishing vulnerability levels for the various components; and threat levels to induce failure in the sensitive components.

Phase II

Contract Number: F04704-86-C-0060
Start Date: 12/15/1985    Completed: 9/30/1987
Phase II year
1986
Phase II Amount
$500,000
The objective of the phase II research is to create-an analytical capability to determine npbw effects on key integrated circuits applicable to future missile guidance systems. Particle beam threat characteristics will be determined, circuit modeling will be accomplished, model parameters will be established, circuit performance will be projected through exercising the models, and model validity will be determined through beam testing of sample circuits.