The proposed Test Instrument Kit with configurable architecture will allow USAF test engineers and weapon platform contractors to match individual weapon platform test requirements while maintaining a universal Test Module (TM The design is based on system On Chip techniques and employs programmable digital and analog components. The resulting product results in cost reductions, reduced test problems, improved logistics, reduction is size and weight, shortened start-up cycles, and initiates TM standardization and compatible system designs for testing of other weapon platforms.
Keywords: Fpgavhdl Soc Configurable Logic Sensor Telemetry Test Equipment