
Full surface angstrom-level contamination and defect detection on thin glass samplesAward last edited on: 4/4/22
Sponsored Program
SBIRAwarding Agency
NSFTotal Award Amount
$256,000Award Phase
1Solicitation Topic Code
SPrincipal Investigator
Steven MeeksCompany Information
Lumina Instruments Inc
2109 O'Toole Avenue Suite J
San Jose, CA 95131
San Jose, CA 95131
(408) 649-3456 |
sales@lumina-inst.com |
www.lumina-inst.com |
Location: Single
Congr. District: 17
County: Santa Clara
Congr. District: 17
County: Santa Clara
Phase I
Contract Number: 2126628Start Date: 8/1/21 Completed: 1/31/22
Phase I year
2021Phase I Amount
$256,000Phase II
Contract Number: ----------Start Date: 00/00/00 Completed: 00/00/00