Sensor Analytics is develping software which enables semiconductor manufacturers to increase yield and reduce costs by optimizing their defect inspection operations. The firm uses process and economic data to calculate the inspection capacity & sampling plans that provide the greatest financial return. This is accomplished with state of the art stochastic algorithms in proprierary Inspection Planner software. Analogous services are offered for reticle inspection and general metrology operations.. The firm's product - Inspection Manager (IM) was developed for the semiconductor industry, but has applications in all quality intensive manufacturing operations. The product is an enterprise software that helps high-tech factories optimize defect inspection operations IM analyzes data-feeds from factory control systems (MES, YMS, & SPC) to provide real-time predictive analytics for, e.g. process tool excursion risk, mean time to excursion detection, inspection tool loading, and cycle-time impa IM also provides optimized targets to help fabs optimize the above metrics using only its existing tools. A second product - Inspection Planner 1.0 (IP1.0) - is a powerful desktop analysis software that allows comprehensive modeling of defect inspection operations in semiconductor and other high-tech factories. IP1.0 models in detail the cost and yield benefit trade-offs that arise when planning use or purchase of defect inspection tools to improve and/or maintain yields.