Opteos Inc. is proposing a new approach to the measurement of electric fields based on the electrooptics principles. This system promises an extremely high bandwidth of operation, 50GHz to 100GHz, a wide dynamic range up to 60dB, and high accuracy better than 1% full scale. The system is modular with partitioning concepts that allow for inexpensive expansion and easy maintenance. The proposed Phase II effort will involve development of a new architecture for the electrooptic probe, which will feature high sensitivity and better manfacturability.
Benefit: The proposed real time field probing system will have a variety of applications in the test and evaluation of high power microwave (HPM) systems, high speed digital, electronic and RF circuits and EMI/EMC testing.
Keywords: Probe, Electrooptic, Electric Field, Measurement, High Power, Sensitivity